Physics-based inverse modeling of battery degradation with Bayesian methods
Micha C. J. Philipp, Yannick Kuhn, Arnulf Latz, Birger Horstmann

TL;DR
This paper demonstrates how Bayesian inverse modeling, specifically EP-BOLFI and BASQ, can effectively parameterize and validate physical models of battery degradation, improving understanding and prolonging lithium-ion battery life.
Contribution
It introduces the application of Bayesian methods to battery degradation modeling, enabling uncertainty quantification and model validation with less computational effort.
Findings
EP-BOLFI accurately parameterizes SEI growth models with synthetic and real data.
Incorporating human expertise improves model parameterization.
BASQ confirms electron diffusion as the best model for SEI growth.
Abstract
To further improve Lithium-ion batteries (LiBs), a profound understanding of complex battery processes is crucial. Physical models offer understanding but are difficult to validate and parameterize. Therefore, automated machine-learning methods (ML) are necessary to evaluate models with experimental data. Bayesian methods, e.g., Bayesian optimization for likelihood-free inference (EP-BOLFI), stand out as they capture uncertainties in models and data while granting meaningful parameterization. An important topic is prolonging battery lifetime, which is limited by degradation, such as the solid-electrolyte interphase (SEI) growth. As a case study, we apply EP-BOLFI to parametrize SEI growth models with synthetic and real degradation data. EP-BOLFI allows for incorporating human expertise in the form of suitable feature selection, which improves the parametrization. We show that even under…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Battery Technologies Research · Fault Detection and Control Systems
