Synthetic gain for electron-beam spectroscopy
Yongliang Chen, Kebo Zeng, Zetao Xie, Yixin Sha, Zeling Chen, Xudong, Zhang, Shu Yang, Shimeng Gong, Yiqin Chen, Huigao Duan, Shuang Zhang, and Yi, Yang

TL;DR
This paper introduces synthetic complex frequency waves to improve electron-beam spectroscopy by amplifying spectral features and retrieving hidden resonances, enhancing imaging quality and quantum interaction resolution in nanoscale materials.
Contribution
The authors propose a novel method of synthetic complex frequency waves that act as virtual gain, mitigating losses and revealing buried spectral features in electron-beam spectroscopy.
Findings
Enhanced spectral feature visibility in measurements
Complete retrieval of buried resonance excitations
Improved hyperspectral imaging quality
Abstract
Electron-beam microscopy and spectroscopy featuring atomic-scale spatial resolution have become essential tools used daily in almost all branches of nanoscale science and technology. As a natural supercontinuum source of light, free electrons couple with phonons, plasmons, electron-hole pairs, inter- and intra-band transitions, and inner-shell ionization. The multiple excitations, intertwined with the intricate nature of nanostructured samples, present significant challenges in isolating specific spectral characteristics amidst complex experimental backgrounds. Here we introduce the approach of synthetic complex frequency waves to mitigate these challenges in free-electron--light interaction. The complex frequency waves, created through causality-informed coherent superposition of real-frequency waves induced by free electrons, offer virtual gain to offset material losses. This…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Electrochemical Analysis and Applications · Analytical Chemistry and Sensors
