Evaluating the Performance of a D-Wave Quantum Annealing System for Feature Subset Selection in Software Defect Prediction
Ashis Kumar Mandal, Md Nadim, Chanchal K. Roy, Banani Roy, Kevin A., Schneider

TL;DR
This paper explores using a D-Wave quantum annealing system to select feature subsets for software defect prediction, demonstrating comparable prediction accuracy but with significantly reduced computation time.
Contribution
It formulates feature subset selection as an optimization problem solved by a D-Wave QA system, showing its viability and efficiency in software defect prediction tasks.
Findings
QA-based feature selection improves defect prediction accuracy.
D-Wave QPU reduces feature selection time significantly.
Classical and QA methods have comparable prediction performance.
Abstract
Predicting software defects early in the development process not only enhances the quality and reliability of the software but also decreases the cost of development. A wide range of machine learning techniques can be employed to create software defect prediction models, but the effectiveness and accuracy of these models are often influenced by the choice of appropriate feature subset. Since finding the optimal feature subset is computationally intensive, heuristic and metaheuristic approaches are commonly employed to identify near-optimal solutions within a reasonable time frame. Recently, the quantum computing paradigm quantum annealing (QA) has been deployed to find solutions to complex optimization problems. This opens up the possibility of addressing the feature subset selection problem with a QA machine. Although several strategies have been proposed for feature subset selection…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsSoftware Engineering Research · Software Reliability and Analysis Research
