Study of delamination in REBCO coated conductor by transmission electron microscopy

TL;DR

This study uses transmission electron microscopy to investigate the microstructures of REBCO coated conductors, revealing that nano-voids at the interface are linked to low delamination strength, which is crucial for large magnet applications.

Contribution

It provides new insights into the microstructural causes of delamination in REBCO conductors through TEM analysis.

Findings

Nano-voids at the IBAD MgO/Y2O3 interface weaken delamination strength

Low delamination strength is associated with specific interfacial microstructures

TEM reveals microstructural features critical for improving REBCO durability

Abstract

Delamination strength of REBCO is very important for its applications in large magnet projects. This work presented the transmission electron microscopy (TEM) investigation of the microstructures of the REBCO coated conductor to understand its delamination property. We found that the low delamination strength is associated with nano-voids formed at the IBAD MgO/Y2O3 interface.