Zonal shape reconstruction for Shack-Hartmann sensors and deflectometry
Jonquiere Hugo, Mugnier Laurent, Mercier-Ythier Renaud, Michau Vincent

TL;DR
This paper introduces an unbiased data formation model for zonal shape reconstruction in optical metrology, improving accuracy over traditional models by using regularized MAP reconstruction, validated through simulations and experiments.
Contribution
It proposes a new unbiased data formation model for shape reconstruction that removes limitations of classical Fried and Southwell models, enhancing accuracy.
Findings
The new model reduces shape estimation bias.
Regularized MAP reconstruction outperforms classical methods.
Improved high-frequency shape reconstruction on freeform mirrors.
Abstract
Some metrological means, such as Shack-Hartmann, deflectometry sensors or fringe projection profilometry, measure the shape of an optical surface indirectly from slope measurements. Zonal shape reconstruction, a method to reconstruct shape with a high number of degrees of freedom, is used for all of these applications. It has risen in interest with the use of deflectometers for the acquisition of high resolution slope data for optical manufacturing, especially because shape reconstruction is limiting in terms of shape estimation error. Zonal reconstruction methods all rely on the choice of a data formation model, a basis on which the shape will be decomposed, and an estimator. In this paper, we first study the canonical Fried and Southwell models of the literature and analyze their limitations. We show that modeling the slope measurement by a point-wise derivative as they both do can…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Measurement and Metrology Techniques · Optical Systems and Laser Technology · Optical measurement and interference techniques
