Epitaxial aluminum layer on antimonide heterostructures for exploring Josephson junction effects
W. Pan, K.R. Sapkota, P. Lu, A.J. Muhowski, W.M. Martinez, C.L.H., Sovinec, R. Reyna, J.P. Mendez, D. Mamaluy, S.D. Hawkins, J.F. Klem, L.S.L., Smith, D.A. Temple, Z. Enderson, Z. Jiang, and E. Rossi

TL;DR
This paper reports the successful growth of high-quality epitaxial aluminum on antimonide heterostructures, demonstrating supercurrent in Josephson junctions, which advances quantum device research and applications.
Contribution
It introduces a method for epitaxially growing aluminum on antimonide heterostructures with high mobility, enabling exploration of Josephson effects in quantum technologies.
Findings
Sharp superconducting transition at ~1.3 K
Realization of supercurrent states in Josephson junctions
High mobility of epi-Al/antimonide heterostructures
Abstract
In this article, we present results of our recent work of epitaxially-grown aluminum (epi-Al) on antimonide heterostructures, where the epi-Al thin film is grown at either room temperature or below zero C. A sharp superconducting transition at K is observed in these epi-Al films. We further show that supercurrent states are realized in Josephson junctions fabricated in the epi-Al/antimonide heterostructures with mobility cm/Vs. These results clearly demonstrate we have achieved growing high-quality epi-Al/antimonide heterostructures, a promising platform for the exploration of Josephson junction effects for quantum information science and microelectronics applications.
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Taxonomy
TopicsSurface and Thin Film Phenomena · Quantum and electron transport phenomena · Advanced Materials Characterization Techniques
