A simple method to find temporal overlap between THz and X-ray pulses using X-ray-induced carrier dynamics in semiconductors
Yuya Kubota, Takeshi Suzuki, Shigeki Owada, Kenji Tamasaku, Hitoshi Osawa, Tadashi Togashi, Kozo Okazaki, and Makina Yabashi

TL;DR
This paper presents a straightforward method to determine the temporal overlap of THz and X-ray pulses by analyzing X-ray-induced carrier dynamics in semiconductors, achieving picosecond accuracy for pump-probe experiments.
Contribution
It introduces a simple technique utilizing carrier dynamics in silicon and gallium arsenide to accurately measure the timing overlap between THz and X-ray pulses.
Findings
X-ray pulses induce rapid carrier generation reducing THz transmission.
Carrier recombination occurs on nano to microsecond timescales.
Method achieves a timing accuracy of a few picoseconds.
Abstract
X-ray-induced carrier dynamics in silicon and gallium arsenide were investigated through intensity variations of transmitted terahertz (THz) pulses in the pico to microsecond time scale with X-ray free-electron laser and synchrotron radiation. We observed a steep reduction in THz transmission with a picosecond scale due to the X-ray-induced carrier generation, followed by a recovery on a nano to microsecond scale caused by the recombination of carriers. The rapid response in the former process is applicable to a direct determination of temporal overlap between THz and X-ray pulses for THz pump-X-ray probe experiments with an accuracy of a few picoseconds.
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Taxonomy
TopicsSemiconductor materials and interfaces · Crystallography and Radiation Phenomena · Terahertz technology and applications
