Direct Imaging of Transition-Edge Sensors with Scanning SQUID Microscopy
Samantha Walker, Austin Kaczmarek, Jason Austermann, Douglas Bennett,, Shannon M. Duff, Johannes Hubmayr, Ben Keller, Kelsey Morgan, Colin C., Murphy, Daniel Swetz, Joel Ullom, Michael D. Niemack, Katja C. Nowack

TL;DR
This study uses scanning SQUID microscopy to image and analyze the local magnetic response of transition-edge sensors, revealing how device dimensions and proximity effects influence their superconducting transition and resistance behavior.
Contribution
It introduces magnetic imaging with SSM as a novel method for local characterization of TES devices, providing new insights into their transition physics and design considerations.
Findings
Excess diamagnetic response near Nb contacts at higher temperatures.
Proximity effect between Nb and Al-Mn influences transition width.
Device dimensions affect the temperature dependence of resistance.
Abstract
Significant advancements have been made in understanding the physics of transition-edge sensors (TESs) over the past decade. However, key questions remain, particularly a detailed understanding of the current-dependent resistance of these detectors when biased within their superconducting transition. We use scanning superconducting quantum interference device (SQUID) microscopy (SSM) to image the local diamagnetic response of aluminum-manganese alloy (Al-Mn) transition-edge sensors (TESs) near their critical temperature of approximately 175 mK. By doing so, we gain insights into how the device dimensions influence TES transition width, which in turn affects device operation and informs optimal device design. Our images reveal that the Al-Mn thin film near the niobium (Nb) leads exhibits an excess diamagnetic response at temperatures several milli-Kelvin (mK) higher than the bulk of the…
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Taxonomy
TopicsSuperconducting and THz Device Technology · Advanced Thermodynamics and Statistical Mechanics · Physics of Superconductivity and Magnetism
