OmniXAS: A Universal Deep-Learning Framework for Materials X-ray Absorption Spectra
Shubha R. Kharel, Fanchen Meng, Xiaohui Qu, Matthew R. Carbone, Deyu, Lu

TL;DR
OmniXAS introduces a transfer learning framework that significantly accelerates and improves the accuracy of X-ray absorption spectra predictions across multiple elements, reducing reliance on computationally intensive simulations.
Contribution
The paper presents a novel transfer learning approach combining latent space representations, hierarchical training, and cross-fidelity adaptation for universal XAS prediction.
Findings
Up to 69% improvement over element-specific models.
Order-of-magnitude faster XAS modeling compared to first-principles simulations.
Enhanced prediction accuracy through multi-fidelity transfer learning.
Abstract
X-ray absorption spectroscopy (XAS) is a powerful characterization technique for probing the local chemical environment of absorbing atoms. However, analyzing XAS data presents significant challenges, often requiring extensive, computationally intensive simulations, as well as significant domain expertise. These limitations hinder the development of fast, robust XAS analysis pipelines that are essential in high-throughput studies and for autonomous experimentation. We address these challenges with OmniXAS, a framework that contains a suite of transfer learning approaches for XAS prediction, each contributing to improved accuracy and efficiency, as demonstrated on K-edge spectra database covering eight 3d transition metals (Ti-Cu). The OmniXAS framework is built upon three distinct strategies. First, we use M3GNet to derive latent representations of the local chemical environment of…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMachine Learning in Materials Science · X-ray Diffraction in Crystallography · Advanced X-ray and CT Imaging
