Parameter-efficient Bayesian Neural Networks for Uncertainty-aware Depth Estimation
Richard D. Paul, Alessio Quercia, Vincent Fortuin, Katharina N\"oh,, Hanno Scharr

TL;DR
This paper explores combining parameter-efficient fine-tuning methods with Bayesian inference to improve uncertainty estimation and robustness in large-scale Transformer models for monocular depth estimation.
Contribution
It introduces a novel LoRA-inspired PEFT method, CoLoRA, and demonstrates its effectiveness in enhancing Bayesian inference for depth estimation tasks.
Findings
PEFT methods improve Bayesian depth estimation performance
Combining LoRA, BitFit, DiffFit, and CoLoRA enhances uncertainty quantification
Proposed methods outperform traditional approaches in reliability and robustness
Abstract
State-of-the-art computer vision tasks, like monocular depth estimation (MDE), rely heavily on large, modern Transformer-based architectures. However, their application in safety-critical domains demands reliable predictive performance and uncertainty quantification. While Bayesian neural networks provide a conceptually simple approach to serve those requirements, they suffer from the high dimensionality of the parameter space. Parameter-efficient fine-tuning (PEFT) methods, in particular low-rank adaptations (LoRA), have emerged as a popular strategy for adapting large-scale models to down-stream tasks by performing parameter inference on lower-dimensional subspaces. In this work, we investigate the suitability of PEFT methods for subspace Bayesian inference in large-scale Transformer-based vision models. We show that, indeed, combining BitFit, DiffFit, LoRA, and CoLoRA, a novel…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Optical measurement and interference techniques · Advanced Vision and Imaging
