A Novel MOSFET based Single Event Latchup Detection, Current Limiting & Self Power Cycling circuit for Spacecraft systems

TL;DR

This paper introduces a novel MOSFET-based circuit that detects, limits current, and power cycles to prevent single event latch-up in CMOS ICs for space applications, enhancing reliability against space radiation.

Contribution

The paper presents a new integrated circuit design that simultaneously detects, limits, and recovers from SEL events, reducing response time and improving space system robustness.

Findings

Simulation results confirm effective current limiting during SEL events.

Power cycling duration aligns with expected recovery times.

Circuit successfully prevents catastrophic failures in simulated space conditions.

Abstract

Single Event Latch-up (SEL) is one of the prime concerns for CMOS ICs used in space systems. Galactic Cosmic Rays or Solar Energetic Particles (SEP) may trigger the parasitic latch up circuit in CMOS ICs and cause increase in current beyond the safe limits thereby presenting a threat of permanent failure of the IC. Mitigation of the SEL is always a challenging task. The conventional mitigation approaches inherently introduce some response time which presents an uncertainty because during this response time the current may exceed the safe current limits. This paper presents a novel circuit based on MOSFETs which provides end-to-end complete solution of detecting SEL, limiting the current below the set threshold and executing power cycling to restore the normal functioning of the CMOS IC. The proposed circuit has been simulated in MULTISIM and the simulation results match very well with the expected behavior of (i)current limiting and (ii) the total time duration taken in power cycling to bring the SEL sensitive device back to its normal operational state. This circuit can be harnessed by spacecraft system designers to overcome the catastrophic threat of SEL posed by space radiation environment.