Edge-device Collaborative Computing for Multi-view Classification
Marco Palena, Tania Cerquitelli, Carla Fabiana Chiasserini

TL;DR
This paper proposes collaborative inference schemes for edge devices in multi-view classification, reducing bandwidth and computational load while maintaining high accuracy, thus enhancing edge AI performance.
Contribution
It introduces selective collaborative inference schemes that effectively reduce data redundancy and resource consumption in multi-view edge classification systems.
Findings
Selective schemes reduce data transmission by up to 74%.
Inference accuracy remains above 90% with resource savings.
Trade-offs between communication, accuracy, and latency are demonstrated.
Abstract
Motivated by the proliferation of Internet-of-Thing (IoT) devices and the rapid advances in the field of deep learning, there is a growing interest in pushing deep learning computations, conventionally handled by the cloud, to the edge of the network to deliver faster responses to end users, reduce bandwidth consumption to the cloud, and address privacy concerns. However, to fully realize deep learning at the edge, two main challenges still need to be addressed: (i) how to meet the high resource requirements of deep learning on resource-constrained devices, and (ii) how to leverage the availability of multiple streams of spatially correlated data, to increase the effectiveness of deep learning and improve application-level performance. To address the above challenges, we explore collaborative inference at the edge, in which edge nodes and end devices share correlated data and the…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsNeural Networks and Reservoir Computing · Neural Networks and Applications · Advanced Semiconductor Detectors and Materials
MethodsFocus
