XRL: An FMM-Accelerated SIE Simulator for Resistance and Inductance Extraction of Complicated 3-D Geometries
Mingyu Wang, Ping Liu, Jihong Gu, Xiaofan Jia, and Abdulkadir C. Yucel

TL;DR
The paper introduces XRL, an FMM-accelerated SIE simulator that efficiently and accurately extracts broadband resistance and inductance parameters of complex 3-D geometries, significantly reducing computational resources compared to commercial tools.
Contribution
XRL employs a novel basis transformation, an accurate impedance model, and an effective preconditioner to enhance the efficiency and accuracy of broadband RL extraction for complicated structures.
Findings
XRL reduces computational time by up to 93.2 times compared to Ansys Q3D.
XRL requires significantly less memory resources, up to 14.2 times less.
XRL accurately computes RL parameters for various practical large-scale structures.
Abstract
A fast multipole method (FMM)-accelerated surface integral equation (SIE) simulator, called XRL, is proposed for broadband resistance/inductance (RL) extraction under the magneto-quasi-static assumption. The proposed XRL has three key attributes that make it highly efficient and accurate for broadband RL extraction of complicated 3-D geometries: (i) The XRL leverages a novel centroid-midpoint basis transformation while discretizing surface currents, which allows converting edge-based vector potential computations to panel-based scalar potential computations. Such conversion makes the implementation of FMM straightforward and allows for drastically reducing the memory and computational time requirements of the simulator. (ii) The XRL employs a highly accurate equivalent surface impedance model that allows extracting RL parameters at low frequencies very accurately. (iii) The XRL makes…
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Taxonomy
TopicsNon-Destructive Testing Techniques · Electron and X-Ray Spectroscopy Techniques · Magnetic Field Sensors Techniques
