Outlier Detection with Cluster Catch Digraphs
Rui Shi, Nedret Billor, Elvan Ceyhan

TL;DR
This paper presents new outlier detection algorithms based on Cluster Catch Digraphs that effectively handle high-dimensional data and arbitrary cluster shapes, demonstrating robustness and improved accuracy through simulations and real-world data tests.
Contribution
Introduction of shape-adaptive and high-dimensional capable CCD-based outlier detection algorithms with demonstrated robustness and effectiveness.
Findings
U-MCCD efficiently detects outliers with high true negative rates.
SU-MCCD improves detection in non-uniform clusters.
Algorithms perform well across various contamination levels.
Abstract
This paper introduces a novel family of outlier detection algorithms based on Cluster Catch Digraphs (CCDs), specifically tailored to address the challenges of high dimensionality and varying cluster shapes, which deteriorate the performance of most traditional outlier detection methods. We propose the Uniformity-Based CCD with Mutual Catch Graph (U-MCCD), the Uniformity- and Neighbor-Based CCD with Mutual Catch Graph (UN-MCCD), and their shape-adaptive variants (SU-MCCD and SUN-MCCD), which are designed to detect outliers in data sets with arbitrary cluster shapes and high dimensions. We present the advantages and shortcomings of these algorithms and provide the motivation or need to define each particular algorithm. Through comprehensive Monte Carlo simulations, we assess their performance and demonstrate the robustness and effectiveness of our algorithms across various settings and…
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Taxonomy
TopicsAnomaly Detection Techniques and Applications · Artificial Immune Systems Applications
