Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

TL;DR

This paper defines gain and noise for impedance matching networks in scanning microwave microscopy, compares various techniques, and demonstrates their performance at frequencies up to 28 GHz with a maximum gain of 9504.7 S.

Contribution

It introduces a measurement-independent definition of gain and noise for impedance matching networks and compares different matching techniques in microwave microscopy.

Findings

Maximal gain of 9504.7 S achieved at 28 GHz

Impedance matching devices include Beatty line, tuner, and interferometric setups

Definitions enable comparison independent of measurement instruments

Abstract

In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens.