New interferometric aperture masking technique for full transverse beam characterization using synchrotron radiation

TL;DR

This paper introduces a novel interferometric aperture masking method inspired by astronomy, enabling complete 2-D transverse beam characterization of synchrotron radiation in a single measurement, improving efficiency over traditional techniques.

Contribution

The paper presents a new multi-aperture masking technique and data analysis method that allows full 2-D beam reconstruction in a single acquisition.

Findings

Successful beam characterization at ALBA synchrotron source

Single-acquisition 2-D beam reconstruction achieved

Method reduces measurement time compared to traditional approaches

Abstract

Emittance measurements using synchrotron radiation are usually performed using x-rays to avoid diffraction limits. Interferometric techniques using visible light are also used to measure either the horizontal or the vertical beam projection. Several measurements rotating the interferometry axis are needed to obtain a full beam reconstruction. In this report we present a new interferometric multi-aperture masking technique and data analysis, inspired by astronomical methods, that are able to provide a full 2-D transverse beam reconstruction in a single acquisition. Results of beam characterization obtained at ALBA synchrotron light source will also been shown.