Observation of Interface Piezoelectricity in Superconducting Devices on Silicon
Haoxin Zhou, Eric Li, Kadircan Godeneli, Zi-Huai Zhang, Shahin, Jahanbani, Kangdi Yu, Mutasem Odeh, Shaul Aloni, Sin\'ead Griffin, Alp, Sipahigil

TL;DR
This paper reports the first experimental observation of interface piezoelectricity in aluminum-silicon junctions, revealing a significant loss mechanism affecting superconducting qubits and highlighting the need for engineered solutions to improve qubit performance.
Contribution
It experimentally demonstrates interface piezoelectricity in superconducting device interfaces and models its impact on qubit quality factors, a previously unobserved loss channel.
Findings
Interface piezoelectricity observed at aluminum-silicon junctions.
Piezoelectric surface loss limits qubit quality factors to 10^4-10^8.
Electromechanical coupling comparable to weakly piezoelectric substrates.
Abstract
The evolution of superconducting quantum processors is driven by the need to reduce errors and scale for fault-tolerant computation. Reducing physical qubit error rates requires further advances in the microscopic modeling and control of decoherence mechanisms in superconducting qubits. Piezoelectric interactions contribute to decoherence by mediating energy exchange between microwave photons and acoustic phonons. Centrosymmetric materials like silicon and sapphire do not display piezoelectricity and are the preferred substrates for superconducting qubits. However, the broken centrosymmetry at material interfaces may lead to piezoelectric losses in qubits. While this loss mechanism was predicted two decades ago, interface piezoelectricity has not been experimentally observed in superconducting devices. Here, we report the observation of interface piezoelectricity at an aluminum-silicon…
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Taxonomy
TopicsAdvanced MEMS and NEMS Technologies · Acoustic Wave Resonator Technologies · Electronic Packaging and Soldering Technologies
