Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM
Jean Le Gra\"et, Aur\'elia Secroun, Marie Tourneur-Silvain, \'Eric, Kajfasz, Jean-Luc Atteia, Olivier Boulade, Alix Nouvel de la Fl\`eche,, Herv\'e Geoffray, William Gillard, St\'ephanie Escoffier, Francis Fortin,, Nicolas Fourmanoit, Sma\"in Kermiche, Herv\'e Valentin

TL;DR
This paper introduces a universal methodology for characterizing the conversion gain of CMOS APS detectors, validated on detectors used in Euclid and SVOM missions, enhancing accuracy in flux estimation for astronomical instruments.
Contribution
It presents a new, universally applicable framework for IR hybrid detector characterization, addressing intrinsic property decorrelation and validation on real detectors.
Findings
Validated methods on Euclid's H2RG detector
Identified subtle detector behaviors
Enhanced flux estimation accuracy
Abstract
With the expanding integration of infrared instruments in astronomical missions, accurate per-pixel flux estimation for near-infrared hybrid detectors has become critical to the success of these missions. Based on CPPM's involvement in both SVOM/Colibri and Euclid missions, this study introduces universally applicable methods and framework for characterizing IR hybrid detectors and decorrelating their intrinsic properties. The characterization framework, applied to the ALFA detector and \Euclid's H2RG, not only validates the proposed methods but also points out subtle behaviors inherent to each detector.
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