Pseudospectral method for solving PDEs using Matrix Product States
Jorge Gidi, Paula Garc\'ia-Molina, Luca Tagliacozzo, Juan Jos\'e Garc\'ia-Ripoll

TL;DR
This paper introduces a pseudospectral method using matrix product states (MPS) combined with Hermite Distributed Approximating Functionals (HDAF) to efficiently solve time-dependent PDEs like the Schrödinger equation, offering improved accuracy and memory efficiency.
Contribution
It extends HDAF to MPS, creating a highly accurate pseudospectral approach that surpasses traditional methods in accuracy and memory efficiency for quantum PDE simulations.
Findings
HDAF-MPS outperforms finite difference methods in accuracy.
HDAF avoids Fourier transforms, improving split-step method performance.
MPS provides exponential memory advantage enabling larger discretizations.
Abstract
This research focuses on solving time-dependent partial differential equations (PDEs), in particular the time-dependent Schr\"odinger equation, using matrix product states (MPS). We propose an extension of Hermite Distributed Approximating Functionals (HDAF) to MPS, a highly accurate pseudospectral method for approximating functions of derivatives. Integrating HDAF into an MPS finite precision algebra, we test four types of quantum-inspired algorithms for time evolution: explicit Runge-Kutta methods, Crank-Nicolson method, explicitly restarted Arnoli iteration and split-step. The benchmark problem is the expansion of a particle in a quantum quench, characterized by a rapid increase in space requirements, where HDAF surpasses traditional finite difference methods in accuracy with a comparable cost. Moreover, the efficient HDAF approximation to the free propagator avoids the need for…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMaterial Properties and Processing · Surface Roughness and Optical Measurements · Optics and Image Analysis
