Precision determination of the track-position resolution of beam telescopes
M. Antonello, L. Eikelmann, E. Garutti, R. Klanner, J. Schwandt, G., Steinbr\"uck, A. Vauth

TL;DR
This paper introduces a precise method for determining the spatial resolution of beam tracking telescopes using segmented silicon detectors with charge digitization, validated through simulations and real beam tests.
Contribution
A novel method for accurately measuring beam track-position resolution using segmented silicon detectors and charge digitization, addressing noise and other effects.
Findings
DUT spatial resolution < 1 μm for normal incidence with two-pixel clusters
Validated method with EUDET beam telescope and CMS prototype sensor
Effective handling of cross-talk, noise, and δ-electrons in resolution measurement
Abstract
Beam tests using tracking telescopes are a standard method for determining the spatial resolution of detectors. This requires the precise knowledge of the position resolution of beam tracks reconstructed at the Device Under Test (DUT). A method is proposed which achieves this using a segmented silicon detector with readout with charge digitization. It is found that the DUT spatial resolution for particles with normal incidence is less than 1 m for events where clusters consist of two pixels (or strips). Given this accuracy, the residual of the beam track-position at the DUT and the position reconstructed in the DUT provides the beam track-position resolution distribution. The method is developed using simulated events, which are also used to study how to deal with cross-talk, electronics noise, energetic -electrons, and incident beams with a few degrees off the normal to…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Measurement and Metrology Techniques · Adaptive optics and wavefront sensing · Optical Systems and Laser Technology
