Unprecedented Enhancement of Piezoelectricity in Wurtzite Nitride Semiconductors via Thermal Annealing
Shubham Mondal, Md Mehedi Hasan Tanim, Garrett Baucom, Shaurya S., Dabas, Jinghan Gao, Venkateswarlu Gaddam, Jiangnan Liu, Aiden Ross, Long-Qing, Chen, Honggyu Kim, Roozbeh Tabrizian, Zetian Mi

TL;DR
This study demonstrates that simple thermal annealing can dramatically increase the piezoelectric response of ScAlN thin films, achieving record-high electromechanical coupling suitable for advanced acoustic and electronic devices.
Contribution
The paper introduces a scalable thermal annealing process that significantly enhances piezoelectricity in ScAlN, surpassing previous experimental limitations and enabling extreme frequency scaling.
Findings
3.5-fold increase in d33 piezoelectric modulus
Electromechanical coupling coefficient increased from 13.8% to 76.2%
Enhanced piezoelectricity achieved in ultrathin films with improved structural quality
Abstract
The incorporation of rare-earth elements in wurtzite nitride semiconductors, e.g., scandium alloyed aluminum nitride (ScAlN), promises dramatically enhanced piezoelectric responses, critical to a broad range of acoustic, electronic, photonic, and quantum devices and applications. Experimentally, however, the measured piezoelectric responses of nitride semiconductors are far below what theory has predicted. Here, we show that the use of a simple, scalable, post-growth thermal annealing process can dramatically boost the piezoelectric response of ScAlN thin films. We achieve a remarkable 3.5-fold increase in the piezoelectric modulus, d33 for 30% Sc content ScAlN, from 12.3 pC/N in the as-grown state to 45.5 pC/N, which is eight times larger than that of AlN. The enhancement in piezoelectricity has been unambiguously confirmed by three separate measurement techniques. Such a dramatic…
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Taxonomy
TopicsThermal properties of materials · Ferroelectric and Piezoelectric Materials · Semiconductor materials and devices
