A Heavy Ion Monitor on a Chip Based on a Non-Volatile Memory Architecture
Dale Julson, Will Flanagan, Mike Youngs, Aidan Medcalf, Benedict, Anderson, Sharanya Palit, Tim Hossain

TL;DR
This paper evaluates a novel particle detector based on NROM technology for space radiation monitoring, demonstrating high sensitivity to heavy ions through experimental irradiation tests.
Contribution
It introduces a heavy ion monitor on a chip utilizing NROM technology, with experimental validation for space radiation detection applications.
Findings
High sensitivity to high-Z heavy ions
Medium sensitivity to low-Z ions
Effective for space-based heavy ion detection
Abstract
The performance of a particle detector derived from nitride read-only memory (NROM) technology is evaluated, with immediate applications in space-based heavy ion radiation monitoring and detection. Irradiation exposures are performed using 40 MeV/u Kr and 10 MeV/u He particle beams at the Texas A&M University Cyclotron Institute. The results show a strong sensitivity to high-Z heavy ions, and medium sensitivity to low-Z heavy ions.
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Taxonomy
TopicsRadiation Effects in Electronics · CCD and CMOS Imaging Sensors · Ion-surface interactions and analysis
