Emergent cavity junction around metal-on-graphene contacts
Yuhao Zhao, Ma\"elle Kapfer, Kenji Watanabe, Takashi Taniguchi, Oded, Zilberberg, Bjarke S. Jessen

TL;DR
This paper uncovers how metal contacts induce a radial n-doped cavity in graphene, leading to unique transport signatures and emergent Landau levels, advancing understanding of metal-graphene interfaces.
Contribution
It reveals the microscopic origin of contact-induced cavities and their effects on graphene's electronic properties using simulations and experiments.
Findings
Contact induces a radial n-doped cavity around metal contacts.
Cavity causes secondary resistance peaks that decrease with contact size.
Emergent Landau levels form around the contact, demonstrating bulk-boundary correspondence.
Abstract
Harnessing graphene devices for applications relies on a comprehensive understanding of how to interact with them. Specifically, scattering processes at the interface with metallic contacts can induce reproducible abnormalities in measurements. Here, we report on emergent transport signatures appearing when contacting sub-micrometer high-quality metallic top contacts to graphene. Using electrostatic simulations and first-principle calculations, we reveal their origin: the contact induces an n-doped radial cavity around it, which is cooperatively defined by the metal-induced electrostatic potential and Klein tunneling. This intricate mechanism leads to secondary resistance peaks as a function of graphene doping that decreases with increasing contact size. Interestingly, in the presence of a perpendicular magnetic field, the cavity spawns a distinct set of Landau levels that interferes…
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Taxonomy
TopicsGraphene research and applications · Molecular Junctions and Nanostructures · Quantum and electron transport phenomena
