Talbot effect-based sensor measuring grating period change in subwavelength range
Saumya J. Sarkar, M. Ebrahim-Zadeh, and G. K. Samanta

TL;DR
This paper introduces a Fourier transform-based Talbot imaging method that accurately measures tiny changes in grating periods, enabling effective sensing of subwavelength variations in optical and photonic applications.
Contribution
The authors develop a novel Fourier transform technique for Talbot imaging that extends measurement capabilities to submicrometer grating period changes and effective lens characterization.
Findings
Successfully measured grating periods as small as a few micrometers.
Detected sub-micrometer changes in grating periods.
Determined the effective focal length of a thick lens with high accuracy.
Abstract
Talbot length, the distance between two consecutive self-image planes along the propagation axis for a periodic diffraction object (grating) illuminated by a plane wave, depends on the period of the object and the wavelength of illumination. This property makes the Talbot effect a straightforward technique for measuring the period of a periodic object (grating) by accurately determining the Talbot length for a given illumination wavelength. However, since the Talbot length scale is proportional to the square of the grating period, traditional Talbot techniques face challenges when dealing with smaller grating periods and minor changes in the grating period. Recently, we demonstrated a Fourier transform technique-based Talbot imaging method that allows for controlled Talbot lengths of a periodic object with a constant period and illumination wavelength. Using this method, we successfully…
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Taxonomy
TopicsPhotonic and Optical Devices · Optical Coatings and Gratings · Advanced MEMS and NEMS Technologies
