Revisiting the measurements and interpretations of DLVO forces
Bo Feng, Xiantang Liu, Xinmin Liu, Yingli Li, Hang Li

TL;DR
This paper critically re-examines DLVO force measurements, identifying widespread anomalies caused by misunderstandings and systematic errors, and calls for careful re-analysis to advance colloid and interface science.
Contribution
It provides a comprehensive explanation for anomalous DLVO force results and emphasizes the need for re-evaluation considering systematic errors and proper EDL theory understanding.
Findings
Anomalous fitted potentials often exceed theoretical limits.
Measured van der Waals forces vary greatly across studies.
Systematic errors and misunderstandings cause pervasive anomalies.
Abstract
The DLVO theory and electrical double layer (EDL) theory are the foundation of colloid and interface science. With the invention and development of surface forces apparatus (SFA) and atomic force microscope (AFM), the measurements and interpretations of DLVO forces (i.e., mainly measuring the EDL force (electrostatic force) FEDL and van der Waals force FvdW, and interpreting the potential {\psi}, charge density {\sigma}, and Hamaker constant H) can be greatly facilitated by various surface force measurement techniques, and would have been very promising in advancing the DLVO theory, EDL theory, and colloid and interface science. However, although numerous studies have been conducted, pervasive anomalous results can be identified throughout the literature, main including: (1) the fitted {\psi}/{\sigma} is normally extremely small ({\psi} can be close to or (much) smaller than…
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Taxonomy
TopicsAdvanced Fiber Optic Sensors
