Inference of Heterogeneous Material Properties via Infinite-Dimensional Integrated DIC
Joseph Kirchhoff, Dingcheng Luo, Thomas O'Leary-Roseberry, Omar, Ghattas

TL;DR
This paper introduces an advanced PDE-constrained inverse framework, -IDIC, for nondestructively inferring complex, spatially-varying material properties from deformation images, capable of capturing fine details and sharp features.
Contribution
The paper develops -IDIC, a novel infinite-dimensional formulation for material property inference that handles high-dimensional, heterogeneous parameters with regularization and efficient algorithms.
Findings
Successfully characterizes complex material heterogeneities.
Achieves mesh-independent convergence and robustness to noise.
Capable of recovering fine-scale and sharp material features.
Abstract
We present a scalable and efficient framework for the inference of spatially-varying parameters of continuum materials from image observations of their deformations. Our goal is the nondestructive identification of arbitrary damage, defects, anomalies and inclusions without knowledge of their morphology or strength. Since these effects cannot be directly observed, we pose their identification as an inverse problem. Our approach builds on integrated digital image correlation (IDIC, Besnard Hild, Roux, 2006), which poses the image registration and material inference as a monolithic inverse problem, thereby enforcing physical consistency of the image registration using the governing PDE. Existing work on IDIC has focused on low-dimensional parameterizations of materials. In order to accommodate the inference of heterogeneous material propertes that are formally infinite dimensional, we…
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Taxonomy
TopicsAdvancements in Photolithography Techniques · Semiconductor materials and devices
