Orientation-dependent surface radiation damage in $\beta$-Ga2O3 explored by multiscale atomic simulations

TL;DR

This study uses multiscale atomic simulations to understand how different surface orientations of $eta$-Ga2O3 respond to radiation damage, revealing defect formation mechanisms and the influence of temperature.

Contribution

It introduces a combined machine-learning molecular dynamics and DFT approach to analyze orientation-dependent radiation damage in $eta$-Ga2O3 surfaces, providing detailed atomic-level insights.

Findings

Ga vacancies and O interstitials are the main defects across surfaces.

The (010) surface has the lowest defect density due to channeling effects.

Temperature effects depend on specific surface characteristics.

Abstract

Ultrawide bandgap semiconductor $\beta$-Ga2O3 holds extensive potential for applications in high-radiation environments. One of the primary challenges in its practical application is unveiling the mechanisms of surface irradiation damage under extreme conditions. In this study, we investigate the orientation-dependent mechanisms of radiation damage on four experimentally relevant $\beta$-Ga2O3 surface facets, namely, (100), (010), (001), and (-201), at various temperatures. We employ a multiscale atomic simulation approach, combining machine-learning-driven molecular dynamics (ML-MD) simulations and density functional theory (DFT) calculations. The results reveal that Ga vacancies and O interstitials are the predominant defects across all four surfaces, with the formation of many antisite defects Ga_O and few O_Ga observed. Among the two Ga sites and three O sites, the vacancy found in the O2 site is dominant, while the interstitials at the Ga1 and O1 sites are more significant. Interestingly, the (010) surface exhibits the lowest defect density, owing to its more profound channeling effect leading to a broader spread of defects. The influence of temperature on surface irradiation damage of $\beta$-Ga2O3 should be evaluated based on the unique crystal surface characteristics. Moreover, the formation energy and defect concentration calculated by DFT corroborate the results of the MD simulations. Comprehending surface radiation damage at the atomic level is crucial for assessing the radiation tolerance and predicting the performance changes of $\beta$-Ga2O3-based device in high-radiation environments.