Lithography-free patterning of chalcogenide materials for integrated photonic devices
Zhen Hu, Yuru Li, Yan Li, Shunyu Yao, Hongfei Chen, Tao Zhang,, Zhaohuan Ao, Zhaohui Li

TL;DR
This paper introduces a novel laser-induced oxidation method for patterning chalcogenide materials, enabling lithography-free fabrication of integrated photonic devices with high resolution and versatile functionalities, overcoming fabrication challenges related to oxidation sensitivity.
Contribution
The work presents a new laser-induced localized oxidation technique for patterning chalcogenide thin films, eliminating the need for lithography and simplifying fabrication of integrated photonic devices.
Findings
Achieved localized multi-level oxidation with a refractive index contrast of 0.7.
Demonstrated various photonic devices including color printing and spatial light modulation.
Enabled switchable beam focusing using phase-change properties of Sb2S3.
Abstract
Chalcogenide material-based integrated photonic devices have garnered widespread attention due to their unique wideband transparency. Despite their recognized CMOS compatibility, the fabrication of these devices relies predominantly on lithography techniques. However, chalcogenide thin films are highly susceptible to oxidation, necessitating customized process flows and complex protective measures during lithography. These requirements are hardly compatible with current commercial CMOS manufacturing platforms designed for silicon photonics, significantly limiting the practical applications of chalcogenide photonic devices. In this work, we ingeniously exploit the ease of oxidation of chalcogenide materials, presenting a novel laser-induced localized oxidation technique for spatial patterning on chalcogenide thin films, enabling concise lithography-free fabrication of chalcogenide…
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Taxonomy
TopicsPhotonic and Optical Devices · Semiconductor Lasers and Optical Devices · Advanced optical system design
