Thouless energy in Josephson SN-N-NS bridges
S. V. Bakurskiy, V. I. Ruzhickiy, A. A. Neilo, N. V. Klenov, I. I. Soloviev, A. A. Elistratova, A. G. Shishkin, V. S. Stolyarov, and M. Yu. Kupriyanov

TL;DR
This paper investigates how the Thouless energy in Josephson SN-N-NS bridges is affected by interface resistance, providing analytical and numerical insights that align with experimental observations and aid in characterizing interface parameters.
Contribution
It offers a detailed analysis of the Thouless energy suppression due to interface resistance in Josephson bridges, combining analytical and numerical methods.
Findings
Thouless energy is significantly suppressed with increased interfacial resistance.
The temperature dependence of critical current can help determine interface parameters.
Results agree with experimental data on Josephson junctions.
Abstract
We have studied the Thouless energy in Josephson superconductor-normal metal-superconductor (SN-N-NS) bridges analytically and numerically, taking into account the influence of the sub-electrode regions. We have found a significant suppression of the Thouless energy with increasing interfacial resistance, in agreement with experimental results. The analysis of the temperature dependence of the critical current in Josephson junctions in comparison with the expressions for the Thouless energy may allow the determination of the interface parameters of S and N-layers.
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Taxonomy
TopicsNuclear Materials and Properties · Fuel Cells and Related Materials · Power Transformer Diagnostics and Insulation
