Calculation of RF-induced Temporal Jitter in Ultrafast Electron Diffraction

TL;DR

This paper introduces a semi-analytical method to quickly estimate RF-induced temporal jitter in ultrafast electron diffraction setups, aiding in optimizing temporal resolution without extensive measurements.

Contribution

It presents a novel semi-analytical approach for calculating RF-induced jitter, enabling fast estimations and virtual timing in MeV-UED beamlines.

Findings

The method accurately estimates jitter from RF parameters.

Simulation results compare different beamline configurations.

The approach facilitates improved temporal resolution planning.

Abstract

A significant contribution to the temporal resolution of an ultrafast electron diffraction (UED) instrument is arrival time jitter caused by amplitude and phase variation of radio frequency (RF) cavities. In this paper, we present a semi-analytical approach for calculating RF-induced temporal jitter from klystron and RF cavity parameters. Our approach allows fast estimation of temporal jitter for MeV-UED beamlines and can serve as a virtual timing tool when shot-to-shot measurements of RF amplitude and phase jitters are available. A simulation study for the SLAC MeV-UED instrument is presented and the temporal resolution for several beamline configurations are compared.