Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization
Aditya Raghavan, Utkarsh Pratiush, Mani Valleti, Richard Liu, Reece, Emery, Hiroshi Funakubo, Yongtao Liu, Philip Rack, Sergei Kalinin

TL;DR
This paper introduces SI-VAE, a scale-invariant variational autoencoder that identifies features across multiple length scales in microscopy and materials imaging, aiding automated analysis and discovery.
Contribution
The paper presents a novel scale-invariant VAE approach that learns length scale-dependent features from diverse imaging data, enhancing analysis of complex spatial phenomena.
Findings
Successfully applied to ferroelectric domain images
Generalized to electron-beam phenomena in graphene
Applicable to various imaging and simulation data
Abstract
Physical imaging is a foundational characterization method in areas from condensed matter physics and chemistry to astronomy and spans length scales from atomic to universe. Images encapsulate crucial data regarding atomic bonding, materials microstructures, and dynamic phenomena such as microstructural evolution and turbulence, among other phenomena. The challenge lies in effectively extracting and interpreting this information. Variational Autoencoders (VAEs) have emerged as powerful tools for identifying underlying factors of variation in image data, providing a systematic approach to distilling meaningful patterns from complex datasets. However, a significant hurdle in their application is the definition and selection of appropriate descriptors reflecting local structure. Here we introduce the scale-invariant VAE approach (SI-VAE) based on the progressive training of the VAE with…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMedical Image Segmentation Techniques · Industrial Vision Systems and Defect Detection · Image Processing and 3D Reconstruction
