Stage IV baryonic feedback correction for non-Gaussianity inference
Daniela Grand\'on, Elena Sellentin

TL;DR
This paper introduces a Bayesian model averaging approach to mitigate baryonic feedback uncertainties in non-Gaussian weak lensing analyses, enhancing the robustness of cosmological parameter inference for Stage IV surveys.
Contribution
It develops a Bayesian framework that combines multiple baryonic feedback models to improve the reliability of non-Gaussian weak lensing measurements.
Findings
BMA effectively reduces biases from baryonic physics in peak count analyses.
The approach improves the robustness of cosmological constraints under model uncertainty.
Demonstrated success in a Stage IV convergence peak counts context.
Abstract
Non-Gaussian statistics of the projected weak lensing field are powerful estimators that can outperform the constraining power of the two-point functions in inferring cosmological parameters. This is because these estimators extract the non-Gaussian information contained in the small scales. However, fully leveraging the statistical precision of such estimators is hampered by theoretical uncertainties, such as those arising from baryonic physics. Moreover, as non-Gaussian estimators mix different scales, there exists no natural cut-off scale below which baryonic feedback can be completely removed. We therefore present a Bayesian solution for accounting for baryonic feedback uncertainty in weak lensing non-Gaussianity inference. Our solution implements Bayesian model averaging (BMA), a statistical framework that accounts for model uncertainty and combines the strengths of different…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsGaussian Processes and Bayesian Inference · Fault Detection and Control Systems · NMR spectroscopy and applications
