Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM

TL;DR

This paper develops a quantitative force conversion equation for AM-AFM that accurately estimates tip-sample forces across different driving frequencies, resolving overestimation issues at resonance slope.

Contribution

It introduces a new theoretical formulation for force measurement in AM-AFM applicable at arbitrary frequencies, validated through simulations and experiments.

Findings

Conventional force estimation overestimates actual force by about five times at resonance slope.

The new formulation accurately predicts force across various driving frequencies.

Validated by both simulations and experimental data.

Abstract

Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile molecules, such as biomolecules, even while the probe is in intermittent contact with the sample. However, it remains unclear why the tip-sample interaction force estimated from an experimental amplitude value is substantially greater than the actual molecular binding force, despite the successful visualization of molecular dynamics. Here, we formulate a quantitative force conversion equation for arbitrary driving frequencies. Comprehensive theoretical analysis reveals that when the cantilever is excited at the resonance slope, the conventional equation overestimates the actual force by approximately five times, as it is valid only for excitation at the resonance frequency. The theory is validated by simulations and experiments and can be applied to various AM-AFM applications in materials research.