New design paradigm for highly efficient and low noise photodetector
Sagar Chowdhury, Rituraj, Srini Krishnamurthy, Vidya Praveen, Bhallamudi

TL;DR
This paper introduces a novel photodetector design that uses dielectric Mie resonance to achieve high absorption in ultrathin layers, significantly reducing dark current and noise while maintaining high quantum efficiency.
Contribution
The authors propose a new design paradigm leveraging dielectric Mie resonance coupling to enhance light absorption in ultrathin photodetectors, enabling high efficiency and low noise performance.
Findings
Achieves ~90% absorption in <100 nm layers
Reduces dark current by at least two orders of magnitude
Potential for large optical gain through avalanche process
Abstract
Achieving high quantum efficiency (QE) with low dark count is essential for highly sensitive photodetectors (PDs), including single photon avalanche detectors (SPADs). However, high QE requires a thicker absorber region, which leads to high dark current and noise, which in turn affects the detectivity of PDs and the photodetection efficiency and dark count of SPADs.The holy grail of photodetector and avalanche photodiode designs is to achieve highest QE with thinnest absorber and still enable large avalanche to gain as needed. We have developed a new design paradigm which exploits the coupling between dielectric Mie resonance and transverse propagating waves in thin layers. The Mie resonance launches the incident light at an angle in an ultrathin absorber, and when coupled to transverse waves, the light propagates laterally and is fully absorbed owing to the longer optical path.…
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