Continued developments in X-ray speed reading: fast, low noise readout for next-generation wide-field imagers

TL;DR

This paper discusses advancements in X-ray detector technology, electronics, and software algorithms to enable high-speed, low-noise, wide-field X-ray imaging for future space missions.

Contribution

It introduces new readout chips, detector devices, and AI-based processing methods to improve sensitivity, speed, and noise performance in X-ray astronomy imagers.

Findings

Development of the Multi-Channel Readout Chip (MCRC) for fast CCD readout.

Implementation of SiSeRO devices with sub-electron noise performance.

Application of AI algorithms for enhanced signal processing and background screening.

Abstract

Future strategic X-ray astronomy missions will require unprecedentedly sensitive wide-field imagers providing high frame rates, low readout noise and excellent soft energy response. To meet these needs, our team is employing a multi-pronged approach to advance several key areas of technology. Our first focus is on advanced readout electronics, specifically integrated electronics, where we are collaborating on the VERITAS readout chip for the Athena Wide Field Imager, and have developed the Multi-Channel Readout Chip (MCRC), which enables fast readout and high frame rates for MIT-LL JFET (junction field effect transistor) CCDs. Second, we are contributing to novel detector development, specifically the SiSeRO (Single electron Sensitive Read Out) devices fabricated at MIT Lincoln Laboratory, and their advanced readout, to achieve sub-electron noise performance. Hardware components set the stage for performance, but their efficient utilization relies on software and algorithms for signal and event processing. Our group is developing digital waveform filtering and AI methods to augment detector performance, including enhanced particle background screening and improved event characterization. All of these efforts make use of an efficient, new X-ray beamline facility at Stanford, where components and concepts can be tested and characterized.