Valley polarization of Landau levels driven by residual strain in the ZrSiS surface band
Christopher J. Butler, Masayuki Murase, Shunki Sawada, Ming-Chun, Jiang, Daisuke Hashizume, Guang-Yu Guo, Ryotaro Arita, Tetsuo Hanaguri, Takao, Sasagawa

TL;DR
This study reveals that residual strain causes valley polarization of Landau levels in ZrSiS, demonstrated through advanced STM techniques, enabling precise measurement of valley-dependent properties and suggesting strain engineering for electronic control.
Contribution
The paper introduces a novel method to measure valley-specific Landau levels and Berry phases, revealing strain-induced valley polarization in ZrSiS surface bands.
Findings
Valley splitting of Landau levels observed via STM
Residual strain causes valley polarization
Strain as low as 0.1% induces significant effects
Abstract
In a multi-valley electronic band structure, lifting of the valley degeneracy is associated with rotational symmetry breaking in the electronic fluid, and may emerge through spontaneous symmetry breaking order, or through a large response to a small external perturbation such as strain. In this work we use scanning tunneling microscopy to investigate an unexpected rotational symmetry breaking in Landau levels formed in the unusual floating surface band of ZrSiS. We visualize a ubiquitous splitting of Landau levels into valley-polarized sub-levels. We demonstrate methods to measure valley-selective Landau level spectroscopy, to infer unknown Landau level indices, and to precisely measure each valley's Berry phase in a way that is agnostic to the band structure and topology of the system. These techniques allow us to obtain each valley's dispersion curve and infer a rigid valley-dependent…
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Taxonomy
TopicsHeusler alloys: electronic and magnetic properties · Semiconductor materials and interfaces · Advanced Thermoelectric Materials and Devices
