Measurement-device agnostic quantum tomography
Robert St\'arek, Martin Bielak, Miroslav Je\v{z}ek

TL;DR
This paper introduces a measurement-device agnostic method for quantum tomography that detects and mitigates measurement mismatches, enhancing the accuracy of quantum state characterization.
Contribution
It presents a novel approach to identify and correct measurement mismatches in quantum tomography without relying on precise measurement device calibration.
Findings
Successfully detects measurement mismatches in experiments
Reduces systematic errors in quantum state characterization
Improves the accuracy of quantum state control
Abstract
Characterization of quantum states and devices is paramount to quantum science and technology. The characterization consists of individual measurements, which must be precisely known. A mismatch between actual and assumed constituent measurements limits the accuracy of this characterization. We show that such a mismatch introduces reconstruction artifacts in quantum state tomography. We use these artifacts to detect and quantify the mismatch, gaining information about the actual measurement operators. It consequently allows the mitigation of systematic errors in both quantum measurement and state preparation, improving the precision of state control and characterization. The practical utility of our approach is experimentally demonstrated.
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Taxonomy
TopicsIntegrated Circuits and Semiconductor Failure Analysis · Quantum Information and Cryptography · Advanced Electron Microscopy Techniques and Applications
