Heterogeneous integration of high endurance ferroelectric and piezoelectric epitaxial BaTiO$_3$ devices on Si
Asraful Haque, Harshal Jason D'Souza, Shubham Kumar Parate, Rama Satya, Sandilya, Srinivasan Raghavan, Pavan Nukala

TL;DR
This paper presents a novel two-step method for integrating high-quality, high-endurance ferroelectric BaTiO$_3$ devices onto silicon, enabling advanced microelectronic applications with improved durability and performance.
Contribution
The authors develop a new two-step synthesis and transfer process for epitaxial BaTiO$_3$ on silicon, demonstrating high endurance and addressing film cracking issues.
Findings
High-quality BaTiO$_3$ capacitors on Si with Pr of 7 μC/cm²
Endurance of over 10^6 switching cycles
Successful transfer and growth of large-area templated layers
Abstract
Integrating epitaxial BaTiO (BTO) with Si is essential for leveraging its ferroelectric, piezoelectric, and nonlinear optical properties in microelectronics. Recently, heterogeneous integration approaches that involve growth of BTO on ideal substrates followed by transfer to a desired substrate show promise of achieving excellent device-quality films. However, beyond simple demonstrations of the existence of ferroelectricity, robust devices with high endurance were not yet demonstrated on Si using the latter approach. Here, using a novel two-step approach to synthesize epitaxial BTO using pulsed laser deposition (PLD) on water soluble Sr3Al2O7 (SAO) (on SrTiO (STO) substrates), we demonstrate successful integration of high-quality BTO capacitors on Si, with Pr of 7 uC/cm2, Ec 150 kV/cm, ferroelectric and electromechanical endurance of greater than cycles. We further…
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Taxonomy
TopicsFerroelectric and Piezoelectric Materials
