Stripe 82-XL: the $\sim$54.8 deg$^2$ and $\sim$18.8 Ms Chandra and XMM-Newton point source catalog and number of counts

TL;DR

The S82-XL catalog significantly expands the Stripe 82X survey by including additional archival Chandra and XMM-Newton data, covering a larger area with deeper flux limits, and providing a comprehensive resource for studying luminous AGNs.

Contribution

This paper presents an enhanced, larger, and deeper X-ray point source catalog (S82-XL) with extensive multiwavelength data, improving upon the original Stripe 82X catalog.

Findings

Catalog contains 22,737 X-ray sources with >4σ significance.

Coverage of ~54.8 deg² with deeper flux limits across multiple bands.

Identifies sources with a wide range of luminosities and redshifts, including up to z~6.

Abstract

We present an enhanced version of the publicly-available Stripe 82X catalog (S82-XL), featuring a comprehensive set of 22,737 unique X-ray point sources identified with a significance $\gtrsim 4\sigma$. This catalog is four times larger than the original Stripe 82X catalog, by including additional archival data from the Chandra and XMM-Newton telescopes. Now covering $\sim54.8$ deg$^2$ of non-overlapping sky area, the S82-XL catalog roughly doubles the area and depth of the original catalog, with limiting fluxes (half-area fluxes) of 3.4$\times 10^{-16}$ (2.4$\times 10^{-15}$), 2.9$\times 10^{-15}$ (1.5$\times 10^{-14}$), and 1.4$\times 10^{-15}$ (9.5$\times 10^{-15}$) erg s$^{-1}$ cm$^{-2}$ across the soft (0.5-2 keV), hard (2-10 keV), and full (0.5-10 keV) bands, respectively. S82-XL occupies a unique region of flux-area parameter space compared to other X-ray surveys, identifying sources with rest-frame luminosities from $1.2\times 10^{38}$ to $1.6\times 10^{47}$ erg s$^{-1}$ in the 2-10 keV band (median X-ray luminosity, $7.2\times 10^{43}$ erg s$^{-1}$), and spectroscopic redshifts up to $z\sim6$. By using hardness ratios, we derived Active Galactic Nuclei (AGNs) obscuration obtaining a median value of $N_H=21.6_{-1.6}^{+1.0}$, and an overall, obscured fraction ($\log N_H/\mathrm{cm^{-2}}>22$) of $\sim 36.9\%$. S82-XL serves as a benchmark in X-ray surveys and, with its extensive multiwavelength data, is especially valuable for comprehensive studies of luminous AGNs.