A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy

TL;DR

This paper introduces a versatile side entry laser system for scanning transmission electron microscopes, enabling flexible sample illumination, modification, and direct ablation, thus expanding the microscope's capabilities towards atomic-scale fabrication.

Contribution

The paper presents a novel side entry laser system with a removable mirror and vacuum-compatible design, allowing for easy alignment, modification, and direct material ablation within an electron microscope.

Findings

Enables precise sample illumination without tilting.

Allows easy modification and exchange of system parts.

Potential to transform electron microscopy into a synthesis platform.

Abstract

We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed.