Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by Scanning Precession Electron Diffraction Tomography
E.F. Rauch (SIMaP), Patrick Harrison (SIMaP), Saurabh Mohan Das,, William Goncalves (MATEIS), Alessandra Da Silva, Xinren Chen, Nicola Vigan\`o, (MATEIS, ESRF), Christian H. Liebscher, Wolfgang Ludwig (MATEIS), Xuyang Zhou

TL;DR
This study demonstrates a method to accurately determine five-parameter grain boundary characteristics in nanocrystalline Ni-W using SPED tomography, overcoming challenges posed by twin reflections and enabling detailed 3D boundary analysis.
Contribution
The paper introduces an automated post-processing approach to identify shared reflections, improving 3D grain boundary reconstruction accuracy in nanocrystalline materials.
Findings
Achieved high-fidelity 3D grain shape reconstruction in Ni-W nanocrystals.
Obtained boundary normal directions with less than 3° error for small boundary sizes.
Enabled precise characterization of complex grain boundaries in nanoscale materials.
Abstract
Determining the full five-parameter grain boundary characteristics from experiments is essential for understanding grain boundaries impact on material properties, improving related models, and designing advanced alloys. However, achieving this is generally challenging, in particular at nanoscale, due to their 3D nature. In our study, we successfully determined the grain boundary characteristics of an annealed nickel-tungsten alloy (NiW) nanocrystalline needle-shaped specimen (tip) containing twins using Scanning Precession Electron Diffraction (SPED) Tomography. The presence of annealing twins in this face-centered cubic (fcc) material gives rise to common reflections in the SPED diffraction patterns, which challenges the reconstruction of orientation-specific virtual dark field (VDF) images required for tomographic reconstruction of the 3D grain shapes. To address this, an automated…
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