Laser Fault Injection Attacks against Radiation Tolerant TMR Registers

TL;DR

This paper investigates the vulnerability of radiation-tolerant TMR registers in IoT devices to laser fault injection attacks, demonstrating the ability to induce faults and potentially compromise security.

Contribution

It presents the first analysis of laser fault injection on radiation-tolerant TMR registers, revealing their susceptibility to transient faults.

Findings

Successful fault injection into TMR registers

Demonstrated potential security vulnerabilities

Highlights need for improved fault resistance

Abstract

Security requirements for the Internet of things (IoT), wireless sensor nodes, and other wireless devices connected in a network for data exchange are high. These devices are often subject to lab analysis with the objective to reveal secret hidden information. One kind of attacks to reveal the cryptographic key is to perform optical Fault Injection attacks. In this work, we investigated the IHP radiation tolerant shift registers built of Triple Modular Redundant flip-flops. In our experiments, we were able to inject different transient faults into TMR registers.