Analytical Aberration Theory for Plane-symmetric Optical Systems and its Application in the Analysis of Distortion in Freeform Spectrometers
Yuxuan Liu

TL;DR
This paper develops an analytical aberration theory for plane-symmetric optical systems, including freeform surfaces, and demonstrates its application in analyzing distortion in complex spectrometers, offering insights beyond traditional raytracing methods.
Contribution
The work generalizes paraxial optics and wavefront aberration expansion to include freeform surfaces and higher-order effects, providing a new analytical tool for distortion analysis in plane-symmetric systems.
Findings
Analytical aberration coefficients agree with raytracing results for certain systems.
The theory reveals the contribution of surface and induced aberrations to distortion.
Limitations identified in the theory when higher-order aberrations are significant.
Abstract
The recent history of optical design saw a progressive trend of also designing without rotational symmetry, especially spectrometers due to the use of reflective and diffractive elements in their designs. A freeform hyperspectral imager design in CubeSat format is presented in this work, which has large deviation from rotational symmetry. Based on a generalization of paraxial optics and wavefront aberration expansion applicable to plane-symmetric systems, in this dissertation we derived the aberration coefficients of aberration types in the third group for plane-symmetric systems that include the second order effects of the light beam footprint on optical surfaces. We also expanded the theory to include the contributions from freeform surfaces and induced aberrations. For the application to plane-symmetric spectrometers, the aberration coefficients related to distortion are of special…
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Taxonomy
TopicsOptical Polarization and Ellipsometry
