On the characteristics of helium filled nano-pores in amorphous silicon thin films
Bertrand Lacroix, Asunci\'on Fern\'andez, N. C. Pyper, Alex J. W., Thom, and Colm T. Whelan

TL;DR
This study combines theoretical and experimental techniques to characterize helium-filled nanopores in amorphous silicon, revealing that helium behavior is consistent across pores, bubbles, and bulk phases, with properties mainly governed by helium density.
Contribution
It provides a parameter-free theoretical analysis validated by experiments, demonstrating the similarity of helium behavior in different confined environments.
Findings
Helium density and pressure in nanopores can be accurately determined.
Helium behavior in nanopores, bubbles, and bulk phases is essentially the same.
Scaling of scattering results confirms the universality of helium properties across environments.
Abstract
The properties of helium-filled nanopores in amorphous silicon are elucidated by combining theoretical knowledge of helium electronic structure with the results of Scanning Transmission electron microscopy/electron energy loss spectroscopy (STEM/EELS). Two of the properties determined are the density and pressure of the confined helium, these being key properties which are needed for application. The experimental data consists, firstly of the shift of the helium 1s^2-> 1s2p(^1P) excitation energy from that of a free atom upon entering a condensed phase, and secondly, the intensities of both the elastically and inelastically scattered electron beams. Analysis uniting theory with the STEM/EELS measurements for both the helium-filled pores and earlier similar studies of helium encapsulated as bubbles in solid silicon is combined with fully trustworthy and closely related data for helium in…
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Taxonomy
TopicsThin-Film Transistor Technologies · Aerogels and thermal insulation
