Leveraging Latent Diffusion Models for Training-Free In-Distribution Data Augmentation for Surface Defect Detection
Federico Girella, Ziyue Liu, Franco Fummi, Francesco Setti, Marco, Cristani, Luigi Capogrosso

TL;DR
This paper introduces DIAG, a training-free, diffusion-based data augmentation method for defect detection that incorporates human guidance, improves over existing techniques, and achieves significant performance gains on the KSDD2 dataset.
Contribution
DIAG is a novel, training-free, diffusion-based in-distribution anomaly generation pipeline that uses human-in-the-loop guidance for improved defect data augmentation.
Findings
Achieves approximately 18% AP improvement with positive samples.
Achieves approximately 28% AP improvement without positive samples.
Operates in a zero-shot manner without fine-tuning.
Abstract
Defect detection is the task of identifying defects in production samples. Usually, defect detection classifiers are trained on ground-truth data formed by normal samples (negative data) and samples with defects (positive data), where the latter are consistently fewer than normal samples. State-of-the-art data augmentation procedures add synthetic defect data by superimposing artifacts to normal samples to mitigate problems related to unbalanced training data. These techniques often produce out-of-distribution images, resulting in systems that learn what is not a normal sample but cannot accurately identify what a defect looks like. In this work, we introduce DIAG, a training-free Diffusion-based In-distribution Anomaly Generation pipeline for data augmentation. Unlike conventional image generation techniques, we implement a human-in-the-loop pipeline, where domain experts provide…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Infrastructure Maintenance and Monitoring · Image Processing and 3D Reconstruction
