Sensitivity fields and parameter estimation from dielectric objects

TL;DR

This paper introduces the concept of Sensitivity Fields in dielectric object imaging, framing phase image formation as a parameter estimation problem, and demonstrates their role in the optimization process across different scattering regimes.

Contribution

It presents a novel theoretical framework linking Sensitivity Fields to the scattering process, enhancing understanding of parameter estimation in dielectric imaging.

Findings

Sensitivity Fields obey a scattering relationship similar to the scattered field.

The approach applies across various scattering strengths.

Provides a unified view of phase image formation as parameter estimation.

Abstract

The quantitative phase image formation process is posed as a problem of parameter estimation from intensity measurements. This approach is inclusive of traditional pixel-oriented imaging, where the sought parameters are the pixel values. The resulting optimization process to find the parameters is then seen to depend on the Sensitivity Field: this is the gradient of the scattered field with respect to the parameters, and it turns out to obey a scattering relationship that is analogous to that of the original scattered field. Examples are given from several regimes of scattering strength.