Switchable Ferroelectricity in Subnano Silicon Thin Films
Hongyu Yu, Shihan deng, Muting Xie, Yuwen Zhang, Xizhi Shi, Jianxin, Zhong, Chaoyu He, Hongjun Xiang

TL;DR
This paper discovers a stable, switchable ferroelectric phase in silicon quantum films, demonstrating potential for silicon-based ferroelectric devices with practical switching properties.
Contribution
It introduces a new stable ferroelectric silicon phase and develops a novel method to simulate ferroelectric switching in silicon bilayers.
Findings
Identified a low-energy, stable ferroelectric silicon phase with significant polarization.
Developed a method combining interatomic potentials and Born effective charges for ferroelectric simulation.
Predicted feasible switching behavior and operational temperature for silicon ferroelectric devices.
Abstract
Recent advancements underscore the critical need to develop ferroelectric materials compatible with silicon. We systematically explore possible ferroelectric silicon quantum films and discover a low-energy variant (hex-OR-2*2-P) with energy just 1 meV/atom above the ground state (hex-OR-2*2). Both hex-OR-2*2 and hex-OR-2*2-P are confirmed to be dynamically and mechanically stable semiconductors with indirect gaps of 1.323 eV and 1.311 eV, respectively. The ferroelectric hex-OR-2*2-P exhibits remarkable in-plane spontaneous polarization up to 120 Pc/m and is protected by a potential barrier (13.33 meV/atom) from spontaneously transitioning to hex-OR-22. To simulate the switching ferroelectricity in electric fields of the single-element silicon bilayer, we develop a method that simultaneously learns interatomic potentials and Born effective charges (BEC) in a single equivariant model with…
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Taxonomy
TopicsAdvanced Sensor and Energy Harvesting Materials · Semiconductor materials and interfaces · Conducting polymers and applications
