Enhancement in Photoluminescence of Pt/Ag-Pt Embedded ZrO2 Thin Films by Plasma Co-sputtering
Shailendra Kumar Mishra, Ibnul Farid, Aritra Tarafder, Joyanti Chutia,, Subir Biswas, Arup Ratan Pal, Neeraj Shukla

TL;DR
This study demonstrates that plasma co-sputtering of Pt/Ag-Pt onto ZrO2 thin films enhances their photoluminescence and plasmonic properties, potentially improving heat resistance in optical devices.
Contribution
It introduces a novel plasma co-sputtering method to embed Pt/Ag-Pt nanoparticles in ZrO2 thin films, enhancing their optical and photoluminescent properties.
Findings
Enhanced photoluminescence observed in the visible range.
Emergence of plasmonic peaks between 403.15 nm and 512.10 nm.
Improved heat-resistance potential of the thin films.
Abstract
Platinum, Silver-Platinum embedded Zirconia (Pt/Ag-Pt ZrO2) thin films have been fabricated on silicon wafers and glass substrates using the plasma co-sputtering method. Zirconia thin films are of significant technological importance due to their remarkable electrical, optical, and mechanical properties, as well as their high melting temperature of 2715{\deg}C, which makes them increasingly attractive for various applications. In this study, ZrO2 thin films were deposited for 3 minutes, followed by the deposition of Pt-Ag/Pt onto the fabricated zirconia thin films, with deposition times ranging from 15 to 60 seconds. The varying deposition times of Pt-Ag/Pt influenced the optical and electronic properties of the thin films due to alterations in their surface roughness. The characteristics of the grown zirconia and Pt/Ag-Pt sputtered zirconia nanostructures were investigated using Atomic…
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Taxonomy
TopicsSemiconductor materials and devices · Electronic and Structural Properties of Oxides · Catalytic Processes in Materials Science
