A new characterization of the dissipation structure and the relaxation limit for the compressible Euler-Maxwell system
Timoth\'ee Crin-Barat, Yue-Jun Peng, Ling-Yun Shou, Jiang Xu

TL;DR
This paper establishes the global well-posedness and strong convergence of solutions for the compressible Euler-Maxwell system, introducing a novel dissipation characterization and error estimates at the relaxation limit.
Contribution
It provides the first global-in-time strong convergence result for the relaxation procedure with ill-prepared data, using a new dissipation structure analysis across frequency regimes.
Findings
Global well-posedness of classical solutions near equilibrium
Quantitative error estimates of order O(ε) between Euler-Maxwell and drift-diffusion models
New dissipation characterization using frequency space partitioning
Abstract
We investigate the three-dimensional compressible Euler-Maxwell system, a model for simulating the transport of electrons interacting with propagating electromagnetic waves in semiconductor devices. First, we show the global well-posedness of classical solutions being a sharp small perturbation of constant equilibrium in a critical regularity setting, uniformly with respect to the relaxation parameter . Then, for all times , we derive quantitative error estimates at the rate between the rescaled Euler-Maxwell system and the limit drift-diffusion model. To the best of our knowledge, this work provides the first global-in-time strong convergence for the relaxation procedure in the case of ill-prepared data. In order to prove our results, we develop a new characterization of the dissipation structure for the linearized Euler-Maxwell system with…
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