MulTi-Wise Sampling: Trading Uniform T-Wise Feature Interaction Coverage for Smaller Samples
Tobias Pett, Sebastian Krieter, Thomas Th\"um, Ina Schaefer

TL;DR
This paper introduces extit{ extbf{ extcolor{blue}{MulTiWise}}} sampling, a method that reduces testing resources by prioritizing critical feature interactions over uniform coverage, especially for high t-values.
Contribution
The paper proposes a novel non-uniform t-wise sampling approach that prioritizes critical features, reducing sample size and generation time compared to traditional uniform methods.
Findings
Reduces sample size compared to uniform coverage methods.
Decreases time needed to generate t-wise samples.
Effective when feature criticality information is available.
Abstract
Ensuring the functional safety of highly configurable systems often requires testing representative subsets of all possible configurations to reduce testing effort and save resources. The ratio of covered t-wise feature interactions (i.e., T-Wise Feature Interaction Coverage) is a common criterion for determining whether a subset of configurations is representative and capable of finding faults. Existing t-wise sampling algorithms uniformly cover t-wise feature interactions for all features, resulting in lengthy execution times and large sample sizes, particularly when large t-wise feature interactions are considered (i.e., high values of t). In this paper, we introduce a novel approach to t-wise feature interaction sampling, questioning the necessity of uniform coverage across all t-wise feature interactions, called \emph{\mulTiWise{}}. Our approach prioritizes between subsets of…
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